Abstract
In recent years, software systems powered by deep learning (DL) techniqueshave significantly facilitated people's lives in many aspects. As the backboneof these DL systems, various DL libraries undertake the underlying optimizationand computation. However, like traditional software, DL libraries are notimmune to bugs, which can pose serious threats to users' personal property andsafety. Studying the characteristics of DL libraries, their associated bugs,and the corresponding testing methods is crucial for enhancing the security ofDL systems and advancing the widespread application of DL technology. Thispaper provides an overview of the testing research related to various DLlibraries, discusses the strengths and weaknesses of existing methods, andprovides guidance and reference for the application of the DL library. Thispaper first introduces the workflow of DL underlying libraries and thecharacteristics of three kinds of DL libraries involved, namely DL framework,DL compiler, and DL hardware library. It then provides definitions for DLunderlying library bugs and testing. Additionally, this paper summarizes theexisting testing methods and tools tailored to these DL libraries separatelyand analyzes their effectiveness and limitations. It also discusses theexisting challenges of DL library testing and outlines potential directions forfuture research.