Abstract
The recent rapid development of deep learning has laid a milestone inindustrial Image Anomaly Detection (IAD). In this paper, we provide acomprehensive review of deep learning-based image anomaly detection techniques,from the perspectives of neural network architectures, levels of supervision,loss functions, metrics and datasets. In addition, we extract the new settingfrom industrial manufacturing and review the current IAD approaches under ourproposed our new setting. Moreover, we highlight several opening challenges forimage anomaly detection. The merits and downsides of representative networkarchitectures under varying supervision are discussed. Finally, we summarizethe research findings and point out future research directions. More resourcesare available athttps://github.com/M-3LAB/awesome-industrial-anomaly-detection.