Abstract
This work studies deep metric learning under small to medium scale data as webelieve that better generalization could be a contributing factor to theimprovement of previous fine-grained image retrieval methods; it should beconsidered when designing future techniques. In particular, we investigateusing other layers in a deep metric learning system (besides the embeddinglayer) for feature extraction and analyze how well they perform on trainingdata and generalize to testing data. From this study, we suggest a newregularization practice where one can add or choose a more optimal layer forfeature extraction. State-of-the-art performance is demonstrated on 3fine-grained image retrieval benchmarks: Cars-196, CUB-200-2011, and StanfordOnline Product.