ML-SIM: A deep neural network for reconstruction of structured illumination microscopy images

  • 2020-03-24 18:42:23
  • Charles N. Christensen, Edward N. Ward, Pietro Lio, Clemens F. Kaminski
  • 24

Abstract

Structured illumination microscopy (SIM) has become an important techniquefor optical super-resolution imaging because it allows a doubling of imageresolution at speeds compatible for live-cell imaging. However, thereconstruction of SIM images is often slow and prone to artefacts. Here wepropose a versatile reconstruction method, ML-SIM, which makes use of machinelearning. The model is an end-to-end deep residual neural network that istrained on a simulated data set to be free of common SIM artefacts. ML-SIM isthus robust to noise and irregularities in the illumination patterns of the rawSIM input frames. The reconstruction method is widely applicable and does notrequire the acquisition of experimental training data. Since the training dataare generated from simulations of the SIM process on images from genericlibraries the method can be efficiently adapted to specific experimental SIMimplementations. The reconstruction quality enabled by our method is comparedwith traditional SIM reconstruction methods, and we demonstrate advantages interms of noise, reconstruction fidelity and contrast for both simulated andexperimental inputs. In addition, reconstruction of one SIM frame typicallyonly takes ~100ms to perform on PCs with modern Nvidia graphics cards, makingthe technique compatible with real-time imaging. The full implementation andthe trained networks are available at http://ML-SIM.com.

 

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